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Generation of Test Patterns for Differential Diagnosis of Digital Circuits
September 1998
AzBa98a
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In proceedings
Francisco Azevedo, Pedro Barahona
K. Apt, P. Codognet, E. Monfroy
Procs. of ERCIM/COMPULOG Workshop on Constraints
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Amsterdam
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Francisco Azevedo and Pedro Barahona, Generation of Test Patterns for Differential Diagnosis of Digital Circuits, in: K. Apt, P. Codognet and E. Monfroy (eds), Procs. of ERCIM/COMPULOG Workshop on Constraints, Amsterdam, September 1998.
<a href="/people/members/view.php?code=f260a0cb31e0c92628691f7473b16e98" class="author">Francisco Azevedo</a> and <a href="/people/members/view.php?code=7e27bc13fad97e99cd21ea6914d55659" class="author">Pedro Barahona</a>, <b>Generation of Test Patterns for Differential Diagnosis of Digital Circuits</b>, in: K. Apt, P. Codognet and E. Monfroy (eds), <u>Procs. of ERCIM/COMPULOG Workshop on Constraints</u>, Amsterdam, September 1998.
@inproceedings {AzBa98a, author = {Francisco Azevedo and Pedro Barahona}, editor = {K. Apt, P. Codognet and E. Monfroy}, title = {Generation of Test Patterns for Differential Diagnosis of Digital Circuits}, booktitle = {Procs. of ERCIM/COMPULOG Workshop on Constraints}, address = {Amsterdam}, month = {September}, year = {1998}, }
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